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X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses

Document Type

Article

Author

Dresselhaus, J.L.; Chapman, H.N.; Bajt, S.; Zakharova, M.; Ivanov, N.; Fleckenstein, H.; Prasciolu, M.; Yefanov, O.; Li, C.; Zhang, W.; Middendorf, P.; Egorov, D.; De Gennaro Aquino, I.

Source

In: Optics Express. (Optics Express, 22 April 2024, 32(9):16004-16015)

Subject

Language

English

ISSN

10944087

Online Access

Full Text (OSA) Open Access (EBSCO) Web of Science JCR 저널정보 Scopus Find it@PNU

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