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Oxygen fugacity buffering in high-pressure solid media assemblies from IW-6.5 to IW+4.5 and application to the v K-edge oxybarometer

Document Type

Article

Author

Righter, K.; Iacovino, K.; Rowland, R.; Erickson, T.M.; Pando, K.; Ross, D.K.; Butterworth, A.L.; Gainsforth, Z.; Jilly-Rehak, C.E.; Westphal, A.J.; Roychoudhury, S.; Prendergast, D.

Source

In: American Mineralogist. (American Mineralogist, 1 March 2023, 108(3):498-513)

Subject

Language

English

ISSN

19453027
0003004X

Online Access

Full Text(De Gruyter) Web of Science JCR 저널정보 Scopus Find it@PNU

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