학술논문
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library
Document Type
Article
Author
Source
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), 1 December 2018, 34(6):735-747)
Subject
Language
English
ISSN
15730727
09238174
09238174