학술논문
Insulator-metal transition of VO2 ultrathin films on silicon: Evidence for an electronic origin by infrared spectroscopy
Document Type
Article
Author
Source
In: Journal of Physics Condensed Matter . (Journal of Physics Condensed Matter, 6 November 2013, 25(44))
Subject
Language
English
ISSN
09538984
1361648X
1361648X