학술논문
The Bystander Affect Detection (BAD) Dataset for Failure Detection in HRI
Document Type
Conference Paper
Author
Source
In: IEEE International Conference on Intelligent Robots and Systems , 2023 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2023. (IEEE International Conference on Intelligent Robots and Systems, 2023, :11443-11450)
Subject
Language
English
ISSN
21530866
21530858
21530858