학술논문
Two-Photon Optical Beam Induced Current for Circuit Level Verification and Validation of a 130 nm Microelectronic Device
Document Type
Conference Paper
Author
Source
In: Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021 , Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021. (Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021, 2021)
Subject
Language
English