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Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction

Document Type

Article

Author

Di Russo, E.; Mavel, A.; Fan Arcara, V.; Dimkou, I.; Grenier, A.; Veillerot, M.; Rochat, N.; Feuillet, G.; Cooper, D.; Damilano, B.; Vézian, S.; Duboz, J.-Y.; Monroy, E.; Bonef, B.; Rigutti, L.

Source

In: Nanotechnology. (Nanotechnology, 13 November 2020, 31(46))

Subject

Language

English

ISSN

13616528
09574484

Online Access

Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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