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Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

Document Type

Article

Author

Blum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z.; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D.

Source

In: IEEE Journal of Photovoltaics. (IEEE Journal of Photovoltaics, January 2014, 4(1):525-531)

Subject

Language

English

ISSN

21563381

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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