학술논문
Robust unfolding of MeV x-ray spectra from filter stack spectrometer data
Document Type
Article
Author
Wong, C.-S.; Strehlow, J.; Broughton, D.P.; Luedtke, S.V.; Huang, C.-K.; Schmidt, J.L.; Schmidt, T.R.; Van Pelt, A.; Alvarez, M.A.; Junghans, A.; Mix, L.T.; Reinovsky, R.E.; Wang, Z.; Wolfe, B.; Albright, B.J.; Batha, S.H.; Palaniyappan, S.; Bogale, A.; Fitzgarrald, R.; Nedbailo, R.; Twardowski, J.; Rusby, D.R.
Source
In: Review of Scientific Instruments . (Review of Scientific Instruments, 1 February 2024, 95(2))
Subject
Language
English
ISSN
10897623
00346748
00346748