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Quantification of Crystalline Phases in Hf0.5Zr0.5O2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations
Document Type
Article
Author
Cervasio, R.; Verseils, M.; Hemme, P.; Brubach, J.-B.; Coati, A.; Vlad, A.; Garreau, Y.; Resta, A.; Roy, P.; Infante, I.C.; Segantini, G.; Rojo Romeo, P.; Vilquin, B.; Amzallag, E.; Creuze, J.
Source
In: ACS Applied Materials and Interfaces. (ACS Applied Materials and Interfaces, 2023)
Subject
Language
English
ISSN
19448252
19448244

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