학술논문
Novel ESD characterization method for bipolar devices using a combined TLP system with dynamic base bias
Document Type
Conference Paper
Author
Source
In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings , Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2023 - Proceedings. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2023, 2023-October)
Subject
Language
English
ISSN
07395159