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Distinct Contact Scaling Effects in MoS2 Transistors Revealed with Asymmetrical Contact Measurements

Document Type

Article

Author

Cheng, Z.; Abuzaid, H.; Franklin, A.D.; Richter, C.A.; Backman, J.; Luisier, M.; Zhang, H.; Davydov, A.V.; Li, G.; Yu, Y.; Cao, L.

Source

In: Advanced Materials. (Advanced Materials, 25 May 2023, 35(21))

Subject

Language

English

ISSN

15214095
09359648

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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