학술논문
GaBiLi - A Novel Focused Ion Beam (FIB) Source for Ion Microscopy and Related Workflows for 3D Tomography with a Top-Down FIB From Liquid Metal Alloy Ion Sources (LMAIS)
Document Type
Article
Author
Source
In: Microscopy and Microanalysis . (Microscopy and Microanalysis, 2023, 29:536-537)
Subject
Language
English
ISSN
14358115
14319276
14319276