학술논문
Compact expression to model the effects of dielectric absorption on analog-to-digital converters
Document Type
Conference Paper
Author
Source
In: IEEE International Conference on Microelectronic Test Structures , 2024 IEEE 36th International Conference on Microelectronic Test Structures, ICMTS 2024 - Proceedings. (IEEE International Conference on Microelectronic Test Structures, 2024)
Subject
Language
English
ISSN
21581029
10719032
10719032