학술논문

Characterization of semi-insulating InP: Cu
Document Type
Conference
Source
Proceedings of the 7th Conference on Semi-insulating III-V Materials, Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on. :273-278 1992
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Indium phosphide
Temperature
Molecular beam epitaxial growth
Schottky barriers
Gallium arsenide
Annealing
Materials science and technology
Space charge
Dielectric materials
Inorganic materials
Language
Abstract
Systematic characterization of InP diffused with Cu have shown that both initially p-type and n-type InP become semi-insulating after Cu diffusion. It is also observed that thermally stable In-Cu rich precipitates form, that the concentration of deep levels is negligible and that InP:Cu samples exhibit inhomogeneities and anomalous transport behavior. These observations support the supposition that the observed semi-insulating behavior in InP:Cu can be best explained by the buried Schottky barrier model, instead of the commonly observed compensation by deep levels.