학술논문

Exemplar based metric learning for robust visual localization
Document Type
Conference
Source
2015 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2015 IEEE International Conference on. :4342-4346 Sep, 2015
Subject
Computing and Processing
Signal Processing and Analysis
Measurement
Visualization
Image retrieval
Robustness
Feature extraction
content-based image retrieval
supervised metric learning
visual localization
place recognition
Language
Abstract
This paper presents an exemplar based metric learning framework dedicated to robust visual localization in complex scenes, e.g. street images. The proposed framework learns off-line a specific (local) metric for each image of the database, so that the distance between a database image and a query image representing the same scene is smaller than the distance between the current image and other images of the database. To achieve this goal, we generate geometric and photometric transformations as proxies for query images. From the generated constraints, the learning problem is cast as a convex optimization problem over the cone of positive semi-definite matrices, which is efficiently solved using a projected gradient descent scheme. Successful experiments, conducted using a freely available geo-referenced image database, reveal that the proposed method significantly improves results over the metric in the input space, while being as efficient at test time. In addition, we show that the model learns discriminating features for the localization task, and is able to gain invariance to meaningful transformations.