학술논문

Analyzing the Impact of Radiation-Induced Failures in Programmable SoCs
Document Type
Periodical
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 63(4):2217-2224 Aug, 2016
Subject
Nuclear Engineering
Bioengineering
Program processors
Reliability
Field programmable gate arrays
Performance evaluation
Sensitivity
Hardware
APSoC
FPGA
radiation
reliability
SoC
Language
ISSN
0018-9499
1558-1578
Abstract
All Programmable System-on-Chip (APSoC) devices are designed to provide higher overall system performance and programmable flexibility at lower power consumption and costs. Although modern commercial APSoCs offer a plethora of advantages, they are prone to experience Single Event Upsets. We investigate the impact of using different system architectures on an APSoC in the overall system failure rate. We consider different memory organization, different communication schemes, and different computing modes. Results show that there are several choices of architectures and resources to be chosen to implement an application in an APSoC, but there are logic resources that can increase or decrease the vulnerability of the entire system to failures in the application execution context.