학술논문
Technology of SOI monolithic active pixel detectors for improvement of I-V characteristics and reliability
Document Type
Conference
Author
Source
2008 15th International Conference on Mixed Design of Integrated Circuits and Systems Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on. :463-465 Jun, 2008
Subject
Language
Abstract
Monolithic active pixel detectors in SOI (Silicon On Insulator) technology are novel sensors of ionizing radiation, which exploit SOI substrates for the integration of readout electronics and a pixel detector. Some important parameters of the devices are breakdown voltage and leakage current. The paper addresses recent developments in the field of the technology of the SOI detectors, which lead to improvement of reliability and current-voltage characteristics of the sensors.