학술논문

Prediction Method of the Breakdown Probability for Multiple Vacuum Gaps in Series Considering Dielectric Recovery Under a Lightning Impulse Voltage
Document Type
Periodical
Source
IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 29(2):753-761 Apr, 2022
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Lightning
Dielectrics
Breakdown voltage
Probability
Prediction methods
Transient analysis
Probability distribution
Dielectric recovery
lightning impulse voltage
multiple vacuum gaps (VGs) in series
prediction of breakdown (BD) probability
Weibull distribution
Language
ISSN
1070-9878
1558-4135
Abstract
The objective of this article is to propose a novel prediction method of the breakdown (BD) probability for multiple vacuum gaps (VGs) in series considering their dielectric recovery under a lightning impulse voltage. Based on the experimental data of the BD probability for each single VG and the calculated voltage distribution of multiple VGs, the BD probability of multiple VGs in series could be calculated by the proposed prediction method. By dielectric tests under the lightning impulse voltage, we see that the calculated BD probability distributions fit well with the experimental results for double VGs and triple VGs in series. Under sphere–plane electrode VGs, the prediction error was approximately 15% in the whole range of BD probabilities. The errors of the 50% BD voltage were 11.4% and 12.9% for double VGs and triple VGs in series, respectively. Therefore, the reliability of this prediction method considering the dielectric recovery was validated. This prediction method could be used to estimate the dielectric strength of multibreak vacuum circuit breaker (VCB) and multiple floating shields inside high-voltage vacuum interrupters.