학술논문

3D Numerical Simulation for Assisting External Latch-up Protection Test Structure Design
Document Type
Conference
Source
29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:508-511 1999
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Numerical simulation
Protection
Testing
Leakage current
Electrostatic discharge
Guidelines
Pattern analysis
Isolation technology
Microelectronics
Materials reliability
Language