학술논문

Low noise static charging with MAGIC
Document Type
Conference
Source
2008 IEEE International Vacuum Electronics Conference Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International. :223-224 May, 2008
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Conductivity
Electron beams
Damping
Wire
Testing
Electromagnetic interference
Noise level
Magnetic noise
Finite difference methods
Geometry
MAGIC
electromagnetic FDTD PIC code
electron beam experiment
precharging
test chamber noise
Language
Abstract
Low noise static charging with the MAGIC electromagnetic FDTD PIC code is demonstrated to nanoamp levels. Unwanted currents in a small chamber resulting from necessarily rapid simulated precharging are damped by an elegant solution of simply overlaying the simulated experiment geometry with a time-dependent magnetic conductivity.