학술논문

Advanced characterization by spectral cathodoluminiscence of 1eV GaInAs inverted metamorphic solar cells
Document Type
Conference
Source
2020 47th IEEE Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2020 47th IEEE. :1047-1050 Jun, 2020
Subject
Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power, Energy and Industry Applications
Photovoltaic cells
Photonic band gap
Strain
Semiconductor device measurement
Junctions
Gallium arsenide
Atomic measurements
cathodoluminescence
transmission electron microscopy
III-V semiconductors
inverted metamorphic solar cells
GaInP compositionally graded buffers
Language
Abstract
Spectral cross-section cathodoluminescence has been used to characterize two equivalent 1eV GaInAs inverted metamorphic solar cells. The measurements reveal a slightly different composition between the GaInAs layers of both samples and the appearance of defects on one of them that is corroborated with external quantum efficiency and transmission electron microscopy. On the other hand, the measurements of the GaInP compositionally graded buffer exhibit a straight correlation between the decrease in the band gap energy and the formation of defects in the GaInAs layers. This work shows an alternative characterization method to perform a rapid quality control for the production of lattice-mismatched devices.