학술논문

Phonon Escape Time Deduced From the Time of Nucleation of Hot Spots in Superconducting Niobium Filaments
Document Type
Periodical
Source
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 26(3):1-4 Apr, 2016
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Phonons
Niobium
Delays
Heating
Superconducting integrated circuits
Temperature distribution
Superconducting transition temperature
Language
ISSN
1051-8223
1558-2515
2378-7074
Abstract
We have observed the voltage response of superconducting niobium strips to overcritical $(I > I_{c})$ step pulses of electrical current. The resistive response appears after a certain delay time $t_{d}$ function of the temperature and of the ratio $I/I_{c}(T)$, which can be analyzed through a time-dependent Ginzburg–Landau equation, along the method introduced by Tinkham. The experimental data can be fitted by using an effective gap relaxation time of a few nanoseconds, independently of the sample widths and of the temperature. Assuming proportionality to sample thickness, this indicates a phonon escape time of about 8 ps per nanometer of thickness for a Nb film dc sputtered on polished crystalline Al 2 O 3 .