학술논문

Fast and efficient approach to predict EMC immunity of complex equipment after a component change
Document Type
Conference
Source
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE Electromagnetic Compatibility - EMC EUROPE, 2020 International Symposium on. :1-6 Sep, 2020
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Transportation
Connectors
Voltage measurement
Electronic equipment
Immunity testing
Aging
Scattering parameters
Pins
Obsolescence
Conducted immunity
Multiport
S-Parameters
Indirect measurement
De-embedding
Language
ISSN
2325-0364
Abstract
This paper describes a fast methodology for managing the obsolescence issues of components in industrial equipment (aeronautical and/or automotive). The objective is to predict Electromagnetic Compatibility (EMC) non-compliance risk or guarantee a non-regression of EMC performances, in conducted immunity, after a component change. This could be achieved through an equivalent test at the component level if the residual voltage at its pins could be estimated. Accordingly, this approach aims to decline conducted immunity requirements, from the connector at the input of an equipment to an obsolete component placed on one of its boards. Which must constitute a faster and cheaper solution than systematic EMC qualification test of the equipment each time a component is replaced.