학술논문

Demonstration of temperature compensated voltage reference integrated circuit designed with 4H-SiC MESFETs
Document Type
Conference
Source
2014 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2014 International. :233-236 Oct, 2014
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Silicon carbide
MESFETs
Temperature measurement
Temperature sensors
Schottky diodes
Integrated circuits
Photonic band gap
Integrated Circuit
Silicon Carbide
SiC
Voltage reference
High temperature
Thermal compensated
MESFET
Language
ISSN
1545-827X
2377-0678
Abstract
This work demonstrate for the first time a functional high temperature compensated Voltage Reference integrated circuit (IC) on 4H-SiC material, built with MESFET devices. A special finger type MESFET that overcome the typical embedded drain leakage of finger type MESFET, was developed for this purpose. The schematic and the principle of the circuit is based on a new concept design that avoid the bandgap reference topology and the necessity of using an operational amplifier (OpAmp), which is not yet developed on SiC. The experimental temperature coefficient (TC) is significantly better than a Zener diode and comparable to the normal bandgap voltage references on silicon, but the present circuit has the advantage to be able to work beyond 250ºC. The circuit contains also a linear temperature sensor.