학술논문
Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 51(6):3486-3493 Dec, 2004
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
Single-event upset (SEU) cross section was measured for several devices under reduced bias with light ions, in particular /spl alpha/-particles. The results show that /spl alpha/-particles can be used, in a simple manner, for testing devices in order to save accelerator time. A proportionality law was found for scaling the reduced bias results to normal operation bias.