학술논문

Picosecond-Scale Terahertz Pulse Characterization With Field-Effect Transistors
Document Type
Periodical
Source
IEEE Transactions on Terahertz Science and Technology IEEE Trans. THz Sci. Technol. Terahertz Science and Technology, IEEE Transactions on. 9(3):262-271 May, 2019
Subject
Fields, Waves and Electromagnetics
Shape
Cavity resonators
Field effect transistors
Free electron lasers
Pulse measurements
Detectors
Frequency measurement
Field-effect transistor (FET)
free-electron laser (FEL)
high-electron mobility transistor (HEMT)
laser cavity resonators
plasma waves
pulse measurements
semiconductor detectors
terahertz (THz)
ultrafast optics
Language
ISSN
2156-342X
2156-3446
Abstract
Precise real-time detection of terahertz (THz) pulses is a key requirement for characterization of pulsed THz sources and nondestructive testing applications. We experimentally evaluate the speed limits of THz rectification in field-effect transistors (FETs) using the example of pulses from a free-electron laser (FEL). We develop an improved model for the description of these THz pulses and demonstrate its validity experimentally by comparison to spectroscopic data as well as to expectation values calculated from FEL physics. The model in conjunction with the high speed of the detectors permits the detection of an exponential rise time of the pulses as short as 5 ps despite a Gaussian postdetection time constant of 11 and 14 ps for a large area and an antenna-coupled detector, respectively. This proves that FETs are excellent compact, room-temperature THz detectors for applications that require an intermediate frequency bandwidth of several tens of gigahertz.