학술논문
Probing SET sensitive volumes in linear devices using focused laser beam at different wavelengths
Document Type
Conference
Author
Source
2007 9th European Conference on Radiation and Its Effects on Components and Systems Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on. :1-7 Sep, 2007
Subject
Language
ISSN
0379-6566
Abstract
The main objective of the work presented here is to explore the ability of laser irradiations to determine the SET sensitive depths of a linear device by using several wavelengths. Laser testing at two wavelengths allows the estimation of sensitive depths. The approach conducted here is applied for the first time to a linear device with very deep sensitive depth. The 1064 nm wavelength seems to be the most adequate one to reveal all sensitive areas and, when comparing with heavy ion experimental data, shows a reasonable agreement with heavy ion cross section.