학술논문

Validation of tie-point concepts by the DEM adjustment approach of TanDEM-X
Document Type
Conference
Source
2010 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International. :2644-2647 Jul, 2010
Subject
Geoscience
Signal Processing and Analysis
Power, Energy and Industry Applications
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Calibration
Data models
Noise
Pixel
Accuracy
Filtering
Noise measurement
TanDEM-X
Tie-points
Language
ISSN
2153-6996
2153-7003
Abstract
The aimed accuracies for the final TanDEM-X DEM of 10m absolute and 2m relative height error will be ensured by calibration data. One crucial data set for the relative accuracy is tie-points that connect adjacent DEM acquisitions in the approximately 4km-overlap-area with each other. In this paper an improved concept for tie-point candidates is presented that is based on averaging a larger region instead of comparing single points. This concept should be more robust against noise. It is validated by applying the DEM calibration on a simulated test area, as real TanDEM-X data was not yet available. Also, the DEM calibration will be validated for the first time on a larger “real” test site by applying the TanDEM-X processing scenario.