학술논문

A Single-Inductor–Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications
Document Type
Periodical
Source
IEEE Solid-State Circuits Letters IEEE Solid-State Circuits Lett. Solid-State Circuits Letters, IEEE. 6:89-92 2023
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Logic gates
Security
Engines
Internet of Things
Generators
Electromagnetics
Encryption
Advanced encryption standard (AES)
digital low dropout voltage regulator (DLDO)
electromagnetic interference (EMI)
electromagnetic (EM)-leaked signature
hardware security
side-channel attack (SCA)
true random number generator (TRNG)
Language
ISSN
2573-9603
Abstract
The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor–triple-output (SITO) buck dc–dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB $\mu \text{V}$ , complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.