학술논문

A 64-Mb Chain FeRAM With Quad BL Architecture and 200 MB/s Burst Mode
Document Type
Periodical
Source
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 18(12):1745-1752 Dec, 2010
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Random access memory
Ferroelectric films
Nonvolatile memory
Error correction codes
Semiconductor device noise
CMOS technology
Bandwidth
Power amplifiers
Energy consumption
Error correction
Burst mode
ferroelectric memory
nonvolatile memory
Language
ISSN
1063-8210
1557-9999
Abstract
A 64-Mb chain ferroelectric RAM (chainFeRAM) is fabricated using 130-nm 3-metal CMOS technology. A newly developed quad bitline architecture, which combines folded bitline configuration with shield bitline scheme, eliminates bitline-bitline (BL-BL) coupling noise. The quad bitline architecture also reduces the number of sense amplifiers and activated bitlines, resulting in the reduction of die size by 6.5% and cell array power consumption by 28%. Fast read/write of 60-ns cycle time as well as reliability improvement are realized by two high-speed error checking and correcting (ECC) techniques: 1) fast pre-parity calculation ECC sequence and 2) all-“0”-write-before-data-write scheme. Moreover, among nonvolatile memories reported so far, the 64 Mb chain FeRAM has achieved the highest read/write bandwidth of 200 MB/s with ECC. The chip size is 87.5 mm$^{2}$ with average cell size of 0.7191 $\mu{\hbox {m}}^{2}$.