학술논문
Research on Reliability Analysis of Diodes in Energy Meters
Document Type
Conference
Author
Source
2023 IEEE 7th Information Technology and Mechatronics Engineering Conference (ITOEC) Information Technology and Mechatronics Engineering Conference (ITOEC), 2023 IEEE 7th. 7:2258-2261 Sep, 2023
Subject
Language
ISSN
2693-289X
Abstract
Analyze the common failure mechanisms of electric energy meter diodes and conduct reliability analysis on them. The main Failure cause of diode is the failure caused by the defect of device itself and the failure caused by improper application. The reliability of diodes can be described by long-term Failure rate. Analyzing the characteristics and selection of transient voltage suppressors, summarizing the principles of TVS selection, is conducive to better completing the analysis and selection of energy meter diodes.