학술논문

An 8 b 700 MS/s 1 b/Cycle SAR ADC Using a Delay-Shift Technique
Document Type
Periodical
Source
IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 63(5):683-692 May, 2016
Subject
Components, Circuits, Devices and Systems
Redundancy
Capacitors
Calibration
Latches
Threshold voltage
Delays
Switches
Energy efficiency
high speed
metastability
redundancy
SAR ADC
Language
ISSN
1549-8328
1558-0806
Abstract
An 8 b 700 MS/s 1 b/cycle asynchronous successive approximation register (SAR) analog to digital converter (ADC) which skips comparator metastability is presented. A delay-shift technique is proposed to shift the delay of comparator to generate a 1.5 b redundancy range and to accelerate comparison speed. This reduces the settling requirement and compensates for the dynamic offset by redundancy. The prototype ADC in 40 nm CMOS technology achieves an SNDR of 43.9 dB at Nyquist rate and consumes 5 mW with a 1.2 V supply. This results in an FoM of 56 fJ/conversion-step. Due to no extra calibration circuit, the core circuit occupies an area of only 0.006 $\text{mm}^{2}$.