학술논문
Simultaneous extraction of thermal and emitter series resistances in bipolar transistors
Document Type
Conference
Author
Source
Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 1997. Proceedings of the. :170-173 1997
Subject
Language
ISSN
1088-9299
Abstract
This paper describes a new method for simultaneous extraction of emitter and thermal resistance in bipolar transistors. The approach is verified using data generated by a compact model including self-heating and numerical simulation with lattice heating. Measured results are presented for the emitter and thermal resistances of self-aligned polysilicon devices and SiGe heterojunction devices.