학술논문

Electron-spectroscopy study on the cause of higher breakdown strength in ethylene-styrene copolymer
Document Type
Conference
Author
Source
Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1987 Electrical Insulation & Dielectric Phenomena - Annual Report 1987, Conference on. :525-530 Oct, 1987
Subject
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Electric breakdown
Plastics
Polyethylene
Energy loss
Current measurement
Thickness measurement
Language
Abstract
It is known that electrons with energies near the ionization potential (referred to as high energy electrons in this paper) play an important role in triggering the damage process in polymeric insulators. High energy electrons break chemical bonds and create free radicals or initiate electron avalanches. However, the detailed process is not fully understood. Contradiction exists between the calculated and the measured carrier mobilities in polymers. The breakdown field of polymers is ca. 10 MVcm −1 and the band gap is ca. 10 eV. This requires an electron mobility of 100 cm 2 V −1 s −1 or a mean free path in the order of 10 nm. However, the experimental mobility values are by many orders of magnitude smaller. If the existence of a mean free path in the 10 nm order could be verified, it would prove the existence of high mobility electrons in a breakdown field.