학술논문
Phase-Dependent Single-Event Sensitivity Analysis of High-Speed A/MS Circuits Extracted from Asynchronous Measurements
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 58(3):1066-1071 Jun, 2011
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
A method for experimental determination of the phase dependence of single-event sensitivity in high-speed A/MS circuits is presented. The technique ensures testing coverage of the complete data cycle and results in a correlation of errors to the data or clock cycle of the circuit. Designers can apply the information, along with knowledge of the circuit state at the time of errors, to make informed radiation-hardening-by-design decisions.