학술논문

Two-dimensional analysis of ion-implanted, bipolar-compatible, long- and short-channel junction field-effect transistors
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 39(11):2576-2583 Nov, 1992
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Analytical models
Poisson equations
FETs
Steady-state
Electron mobility
Charge carrier processes
Failure analysis
Shape
Current-voltage characteristics
Language
ISSN
0018-9383
1557-9646
Abstract
A two-dimensional analysis of ion-implanted, bipolar-compatible, long- and short-channel JFETs is presented. The two-dimensional device simulator PISCES is used to study the steady-state characteristics. The linear and saturation regions are analyzed, and insight about the transition region between them is obtained. Short-channel JFET behavior deviates considerably from the conventional theory developed based on the gradual channel approximation, because the x-direction electric field in the channel of the short-channel JFET is much stronger than that in the long-channel JFET. The study shows that the short-channel JFET has several properties that were not previously emphasized: (a) no pinch-off in saturation operation: (b) free-carrier drift velocity saturates in saturation operation: and (c) power-law I-V characteristics in the cutoff region. Details regarding the shape of the conducting channel, the electric field vectors, the current vectors, and the current-voltage characteristics are provided.ETX