학술논문

A Multicore Chip Load Model for PDN Analysis Considering Voltage–Current-Timing Interdependency and Operation Mode Transitions
Document Type
Periodical
Source
IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 9(9):1669-1679 Sep, 2019
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Load modeling
Integrated circuit modeling
Timing
System-on-chip
Multicore processing
Clocks
Computational modeling
Chip load model
multicore system
operation mode transition
power delivery network
power supply noise
voltage–current-timing interdependency
Language
ISSN
2156-3950
2156-3985
Abstract
Power consumption and current fluctuation are continuously increasing in modern multicore systems. Such current flow may cause severe supply noise via off-chip and on-chip power delivery networks (PDN). Unexpected noise impacts the chip delay performance or even causes malfunction. In traditional practice, PDN designers assume a simple current source-based chip load, but it is often oversimplified, where the load current is modeled only for one or a few operation modes, and it is constant irrelevant to supply noise. In this paper, we propose a new chip load model that enables even off-chip PDN designers to assess the noise impact on circuit performance and use realistic current profile under supply voltage noise. We also integrate a control signal interface so that the model can switch the processor operation modes for finding unexpected noise behavior in design time and pursuing robust PDN design. Experimental results show that the proposed model mostly described by Verilog-A reproduces the current profile, current peak, and timing data well even while it achieves over $300\times $ run-time reduction compared to a transistor-level model. We also experimentally demonstrate that a land-side capacitor is helpful to improve processor timing performance in our test case.