학술논문

From Layout to System: Early Stage Power Delivery and Architecture Co-Exploration
Document Type
Periodical
Source
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 38(7):1291-1304 Jul, 2019
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Computer architecture
Computational modeling
Tools
Optimization
Integrated circuit modeling
Layout
Estimation
Architecture
cross layer
noise analysis
power distribution
power modeling and estimation
Language
ISSN
0278-0070
1937-4151
Abstract
With the reduced noise margin brought by relentless technology scaling, power integrity assurance has become more challenging than ever. On the other hand, traditional design methodologies typically focus on a single design layer without much cross-layer interaction, potentially introducing unnecessary guard-band and wasting significant design resources. Both issues imperatively call for a cross-layer framework for the co-exploration of power delivery (PD) and system architecture, especially in the early design stage with larger design and optimization freedom. Unfortunately, such a framework does not exist yet in the literature. As a step forward, this paper provides a run-time simulation framework of both PD and architecture and captures their interactions. Enabled by the proposed recursive run-time PD model, it can achieve smaller than 1% deviation from SPICE for an entire PD system simulation. Moreover, with seamless interactions among architecture, power and PD simulators, it can simulate actual benchmarks within reasonable time. The experimental results of running PARSEC suite have demonstrated the framework’s capability to discover the co-effect of PD and architecture for early stage design optimization. Moreover, it also shows multiple over-pessimism in traditional PD methodologies. Finally, the framework is able to investigate the impact of dynamic noise on system level oxide breakdown reliability and shows 31%–92% lifetime estimation deviations from typical static analysis.