학술논문
Point-of-Care Testing (POCT) System based on self-Recovery Memoristor Chip with Low Energy Consuption(1.547 TOPS/W) and High Recognition (1142 fram/s)
Document Type
Conference
Author
Source
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Subject
Language
ISSN
2156-017X
Abstract
The Point-of-Care Testing (POCT) system based on image analysis suffers high power consumption, detection delay and lack of privacy security. In this work, we proposed an efficient POCT system based on memristor chip, which can support edge computing and realize real-time recognition of medical graphics. To solve the problem of the decrease of long-term inference accuracy caused by chip degradation, we designed the error correction and in-situ recovery module, which increased the recognition accuracy to 90% after 250 days. Benefit by the high speed and low power consumption of the memristor, the efficiency of POCT system is up to 1.547TOPS/W and the recognition rate is reach to 1142 frames/s.