학술논문

Fixture De-Embedding Challenges for Short 2xThru Structure
Document Type
Conference
Source
2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS) Advanced Packaging and Systems (EDAPS), 2023 IEEE Electrical Design of. :1-3 Dec, 2023
Subject
Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Signal Processing and Analysis
Current measurement
Fixtures
Printed circuits
Integrated circuit interconnections
Packaging
Transmission line measurements
IEEE Standards
Network Parameters
Fixture De-embedding
2xThru
IEEE 370 Standard
Language
ISSN
2151-1233
Abstract
Fixture de-embedding represents a procedure developed to eliminate undesirable fixture effects from the initial measurements, allowing us to isolate and obtain the S-parameters solely for the device under test. Currently one of the most popular methods for fixture de-embedding, that is used in most commercial tools, is 2xThru de-embedding. The main advantage of 2xThru de-embedding is that it significantly reduces required number of measurements and is much easier to implement compared to other traditional methods. “IEEE Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz” provides requirements for fixture design. Based on the requirements 2xThru should have long enough transmission line in the middle. In the present paper will be analyzed the case, when 2xThru does not satisfy requirements of the standard. Particularly, will be considered the case when 2xThru is very short and discontinuity in the fixture is not vanished before it reaches middle point of the structure. We will show in which cases existing de-embedding tools will be able to still extract accurately left and right fixtures from short 2xThru structure.