학술논문

Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)
Document Type
Conference
Source
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Temperature distribution
Cooling
Thermal resistance
Thermal management
Dynamic scheduling
Thermal analysis
System-on-chip
3DFEM
cooling
co-optimization
floor planning
heat sink
hotspot
junction temperature
packaging
power density
scaling
SoC
system-on-chip
thermal analysis
thermal interface material
thermal resistance
TIM
Language
ISSN
1938-1891
Abstract
Surge in compute-demand in consumer products, mobile phones, auto mobiles, datacenters for high performance computing (HPC) applications brings in major thermal challenges. This stems from growth in transistor density over the years and the associated power density increase. Advanced packaging techniques like 2.5D and 3D integration have a compounding effect. Hitting the thermal limits, not only affects the raw performance, power but also limits reliability of the product. Therefore, it has become necessary to foresee appropriate thermal solutions for target applications early in product development phase during thermal/power planning to assess viability of technology choices. In this paper, we assess the temperature distribution & anticipate cooling needs for future thermally-limited SOCs in advanced Angstrom nodes (A14 & A5). Thermal resistance breakdown from multiple sources is carried out to decouple contributions so as to explore possibility of a co-optimization of chip-package-cooling system. Some of the insights from our analysis could aid system software to do thermal aware job scheduling.