학술논문

Comparison of 24 GHz low-noise mixers in CMOS and SiGe:C technologies
Document Type
Conference
Source
2009 European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European. :184-187 Sep, 2009
Subject
Components, Circuits, Devices and Systems
Fields, Waves and Electromagnetics
CMOS technology
Circuits
Silicon germanium
Germanium silicon alloys
Mixers
Gain
Noise figure
Semiconductor device measurement
CMOS process
Narrowband
Language
Abstract
This paper presents a comparison of two low-noise mixers designed in Infineon's 0.13 µm CMOS and 0.35 µm SiGe:C processes. The mixers have been optimized for low-noise performance for narrow-band 24 GHz applications. Both circuits are based on the Gilbert cell and have similar topology. The chips are designed to fulfill high robustness requirements for industrial and automotive applications. The CMOS mixer provides a conversion gain of 7 dB and a double-sideband (DSB) noise figure of 7.5 dB . To the authors' knowledge, this is the lowest reported to date CMOS noise-figure in this frequency range. The SiGe mixer offers a higher gain of 10.5 dB and a lower DSB noise figure of 4.7 dB . Furthermore, it has better linearity of −7.2 dBm compared to −12 dBm input-referred 1dB compression point, measured for the CMOS circuit. The CMOS and SiGe circuits consume 2.8 mA from 1.5 V and 12 mA from a 3.3 V supply, respectively. Performance variation of key parameters has been analyzed in measurement over a wide range of temperatures from −40 °C to 125 °C . The SiGe chip offers better performance stability over temperature.