학술논문
SEE and TID Effects in Transistors and Voltage Reference Devices
Document Type
Conference
Author
Source
2016 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2016 IEEE. :1-8 2016
Subject
Language
Abstract
We tested two transistor and two voltage reference devices for single event effects and combined displacement damage and total ionizing dose effects. The results of these tests are reported along with select on-orbit rate calculations.