학술논문

Binary fringe pattern in infrared phase measuring deflectometry
Document Type
Conference
Source
2021 International Conference of Optical Imaging and Measurement (ICOIM) Optical Imaging and Measurement (ICOIM), 2021 International Conference of. :207-210 Aug, 2021
Subject
Photonics and Electrooptics
Power, Energy and Industry Applications
Phase measurement
Three-dimensional displays
Shape
Shape measurement
Optical variables measurement
Optical imaging
Infrared phase measuring deflectometry (IR PMD)
Defocusing binary fringe
3D shape
Non-continuous specular object
Depth of field (DOF)
Language
Abstract
Infrared phase measuring deflectometry (IR PMD) is a superior PMD technique, which builds the direct relationship between phase and depth to directly calculate 3D shape of the non-continuous specular object from the phase data, instead of integrating the local slope data. IR PMD has been extensively studied because of its advantages of non-contact operation, high-precision measurement, and reducing influence of ambient light. However, there are certain requirements for the depth of field (DOF) in IR PMD system because many specular surfaces have large depth range. To tackle this issue, this paper proposes a novel method based on defocusing binary fringes. This method combines binary fringe defocusing technique and IR PMD technique. This paper discusses the measurement principle and binary defocusing technique, and conducts simulated and practical experiments. The experimental results validate the effectiveness and accuracy of the proposed method.