학술논문
Recent single event effects results for candidate spacecraft electronics for NASA
Document Type
Conference
Author
Source
IEEE Radiation Effects Data Workshop, 2005. Radiation Effects Data Workshop Radiation Effects Data Workshop, 2005. IEEE. :26-35 2005
Subject
Language
ISSN
2154-0519
2154-0535
2154-0535
Abstract
Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.