학술논문
Effect of diffraction-limited divergence and wave front curvature of the Gaussian beam on Michelson interferometer fringes
Document Type
Conference
Author
Source
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on. :21-24 Oct, 2012
Subject
Language
Abstract
The investigation of the interference pattern that appears during the passage of a Gaussian beam through a Michelson interferometer was carried out. That allowed to find the length measurement error due to diffraction-limited divergence and wavefront curvature of the light beam.