학술논문

Single Event Effect Evaluation of the Jetson AGX Xavier Module Using Proton Irradiation
Document Type
Conference
Source
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020 IEEE. :1-4 Nov, 2020
Subject
Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Nuclear Engineering
Photonics and Electrooptics
Graphics processing units
Central Processing Unit
Protons
Redundancy
Testing
Convolution
Software
single event upset
GPU
Upset rates
proton
Language
Abstract
The Single Event Effect (SEE) cross-sections for various operating modes of a Jetson AGX Xavier GPU module were evaluated using proton irradiation. The results show that the error rate can be reduced with redundancy techniques.