부산대학교 도서관

Silicon ring resonators are currently being assessed by several national metrology organizations as thermometers for use in calibration laboratories and in high-accuracy commercial applications. We show that nonlinear refractive index changes due to self-heating and free carrier generation by the interrogating light can be sources of error in temperature measurements with a Si ring-resonator thermometer. Since self-heating and carrier generation depend on material defects and the resonator structure, we show that these effects can be mitigated by optimizing the resonator design and fabrication process.