학술논문
Distinguishing Dielectric Loss From Superconductor Loss Using Flexible Thin-Film Superconducting Resonator Structures
Document Type
Periodical
Author
Source
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 29(5):1-5 Aug, 2019
Subject
Language
ISSN
1051-8223
1558-2515
2378-7074
1558-2515
2378-7074
Abstract
Flexible interconnects with superconducting (SC) traces and polyimide dielectric can provide low signal loss and low thermal conductivity at cryogenic temperatures, and are expected to find use in densely integrated cryogenic electronics systems. The ultra-low loss of SC interconnects at microwave frequencies can be accurately characterized through the use of weakly coupled SC resonators. The high-quality factor resonators provide sensitive measurements of the aggregate loss properties of the conductor and dielectric, as functions of frequency, temperature, and signal power. In this work, resonators with different linewidths were fabricated and tested to study how the linewidth impacts the overall internal resonator loss, in order to better characterize and separate the individual loss components (i.e., dielectric loss vs. conductor loss). The results of this work are important for understanding loss and transmission properties of similarly designed and fabricated transmission line interconnects.